The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 1976
Filed:
Apr. 29, 1974
John Francis Donoghue, Columbus, OH (US);
Industrial Nucleonics Corporation, Columbus, OH (US);
Abstract
A sheet material characteristic monitoring apparatus is provided for use in processes involving the production and contouring of sheet material. In a preferred embodiment, the sheet material characteristic is measured at two or more stationary cross direction locations of the sheet. A digital computer computes a regression equation between the measured values of the sheet characteristic and their respective locations, which equation is evaluated between limits representing the sheet edges to provide a data profile comprising estimated values of the sheet characteristic across the width of the sheet. The data profile may be derived substantially instantaneously. The data profile may further be evaluated between limits representing one or more desired transverse dimensions of the sheet.