The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 1976

Filed:

Apr. 16, 1974
Applicant:
Inventors:

Yasushi Ohnishi, Katsuta, JA;

Shunichi Matsuura, Katsuta, JA;

Assignees:

The Perkin-Elmer Corporation, Norwalk, CT (US);

Hitachi, Ltd., Tokyo, JA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356 96 ; 250458 ; 356 88 ;
Abstract

A fluorescence spectrophotometer having a beam splitter placed between an exit slit of an excitation monochromator and a specimen. Part of the excitation radiation is conducted to a first light quantum meter by said beam splitter and a reference photomultiplier is provided for receiving fluorescence from said first light quantum meter. A second light quantum meter is placed at the position normally occupied by a specimen cell and first and second absorbing cells are disposed in front of said first and second light quantum meters, respectively.


Find Patent Forward Citations

Quick Actions:

Ohnishi, Yasushi. (1976). Fluorescence spectrophotometer for absorption spectrum analysis (U.S. Patent No. 3936190). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/3936190

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…