The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 1976

Filed:

Jan. 02, 1974
Applicant:
Inventors:

Ralph E Aldrich, Acton, MA (US);

Julius Feinleib, Cambridge, MA (US);

Assignee:

Itek Corporation, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
2502 / ; 250568 ; 3401 / ; 235152 ;
Abstract

Apparatus for maintaining image definition and intensity in optical image processing operations. The apparatus comprises an improved photosensitive device responsive to an applied radiation image pattern for establishing internal electric fields each of which are representative of the intensity of different portions of the applied pattern. Associated with the photosensitive device are a plurality of transparent, conductive targets or conductors aligned to receive the different portions of the applied radiation pattern and to establish discrete internal fields in the device which are uniform over the area of each target notwithstanding any non-uniformities that might exist in the intensity distribution of any of the portions of the applied pattern. The apparatus is especially suitable for use in conjunction with parallel optical digital processing systems in which digital data is represented by an array of radiation image bits of differing intensity and is directed through an optical circuit to be processed in a desired manner.


Find Patent Forward Citations

Loading…