The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 1976

Filed:

Dec. 03, 1973
Applicant:
Inventor:

Mario Posnansky, Horgen, CH;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K / ;
U.S. Cl.
CPC ...
733686 ; 733625 ; 73418 ;
Abstract

A measurement apparatus influenced by disturbing ambient temperature variations or fluctuations, said measurement apparatus having a limited volume filled with a medium subjected to such temperature fluctuations. Further, there is provided a compensation element which, under the influence of such disturbing temperature fluctuations, alters the size of a compartment which also contains the medium and thus also alters the aforementioned volume. The dimensions and the coefficient of thermal expansion of the compensation element, while taking into account the coefficient of thermal expansion and the quantity of medium contained in such compartment, are chosen such that the influence of the disturbing temperature fluctuations on the apparatus is compensated.


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