The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 1976
Filed:
Mar. 28, 1974
Donald Jones Channin, East Windsor, NJ (US);
RCA Corporation, , NY (US);
Abstract
A non-destructive method of testing an electrical circuit includes observing birefringent changes in a layer of liquid crystals during the operation of the circuit. The method comprises applying the layer of liquid crystals over the circuit with the liquid crystal molecules oriented in the same direction. A beam of light is directed through the layer of liquid crystals with an optical system adapted to make the birefringent changes visible. The circuit is energized with either an ac or a dc voltage, and the birefringent changes produced by the electric fields, and/or the currents, and/or the temperature distributions in the layer of liquid crystals are observed so that a comparison can be made between the observed birefringent changes and birefringent changes produced by a normally operating circuit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile