The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 1976
Filed:
Jan. 10, 1975
John P Lindley, Redwood City, CA (US);
James Rieden, San Jose, CA (US);
Itek Corporation, Lexington, MA (US);
Abstract
A Bragg cell spectrum analyzer in which the output of the Bragg cell is detected by a unique electro-optic system which allows the selection of any desired dynamic power detection range. As is known in the art, the output of a Bragg cell consists of a radiation spot or spots along a line in which the position of each spot along the line is related to the frequency of a component of the input signal to the Bragg cell, and the intensity of radiation of each spot is proportional to the strength of the component causing that spot. In the disclosed embodiment the output of the Bragg cell is directed upon a cylindrical lens system which expands each spot into a line of radiation. This results in a two dimensional pattern of lines with the position of each line being the same as the position of the radiation spot causing the line, and the intensity of radiation in each line being proportional to the intensity of radiation in the spot causing that line. The two dimensional pattern of radiation, consisting of spaced lines of radiation, is directed through a stepped density filter onto a two dimensional photodiode array. The photodiode array is utilized to detect the position of each line, which indicates the frequency of the input component causing that line, and is utilized to detect the number of photodiodes reaching saturation along the line, which indicates the strength of the component.