The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 1976
Filed:
Aug. 13, 1973
Applicant:
Inventor:
Toyohiko Naono, Tokyo, JA;
Assignee:
Nihon Denshi Kabushiki Kaisha, Tokyo, JA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
2325 / ; 23259 ; 13762511 ;
Abstract
An analyzing apparatus which automatically and sequentially analyzes a large number and variety of chemical samples which are divided into a plurality of fractions, whereby each sample is simultaneously tested with different chemicals under suitable reaction conditions. The system operates under pressurized closed flow conditions, that is to say, the solution flow lines are compressed with an inert gas, whereby the formation of air bubbles in the flow system, oxidization of samples, reagents, the rise of noxious fumes, are prevented.