The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 1976

Filed:

Dec. 30, 1974
Applicant:
Inventors:

Ronald N Borrelli, Moraga, CA (US);

Douglas W Raymond, Berkeley, CA (US);

Assignee:

Zehntel, Inc., Concord, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G01R / ;
U.S. Cl.
CPC ...
2351 / ; 324 / ;
Abstract

A method and apparatus for automatic, programmed, in-circuit component testing and functional testing. A multi-mode measurement unit having an exciter circuit, computing circuit, and a converter circuit is provided for measuring electrical signals. The measurement unit is controlled by a program-commanded measurement unit controller. A plurality of device connection switches are provided for connecting, by a program-commanded switch controller, the computing circuit to selected nodes of a circuit under test. The switch controller and the measurement unit controller receive commands from a programmed processor which executes stored programs of instruction. The programs contain subroutines which correlate with commanded measurement parameters and sequences within the measurement unit.


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