The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 1976
Filed:
Nov. 22, 1974
Sandor Holly, Falls Church, VA (US);
Atlantic Research Corporation, Alexandria, VA (US);
Abstract
Device and process for testing the optical transfer function of a lens system which comprise employing as the object or target the laterally moving-fringe pattern produced by convergence of two monochromatic coherent-radiation beams of equal size and intensity and slightly different frequency. A second fringe pattern may be employed as the reference standard. Both the target and reference patterns can be varied simultaneously in spatial frequency or fringe period. The system and process can test both modulation transfer function and phase transfer function accurately at any monochromatic wavelength produced by an available coherent-radiation source to which the test lens system is transparent, e.g., ultraviolet or shorter, visible, and infrared or longer. When polarized monochromatic radiation is used, the invention can also be employed to determine the polarization characteristics of the lens. The system and process can also test chromatic aberration by successive use of different coherent monochromatic radiation wavelengths.