The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Jun. 26, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Changui Hong, Suwon-si, KR;

Minho Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 74/00 (2026.01); G01R 31/52 (2020.01); G01R 31/64 (2020.01); H10D 1/68 (2025.01); H10W 70/65 (2026.01);
U.S. Cl.
CPC ...
H10P 74/273 (2026.01); G01R 31/52 (2020.01); G01R 31/64 (2020.01); H10D 1/716 (2025.01); H10W 70/65 (2026.01); H10W 70/657 (2026.01);
Abstract

A substrate includes a first input/output region; a first input pad provided in the first input/output region; a first output pad provided in the first input/output region; a first mounting region; a first positive pad provided in the first mounting region and connected to the first input pad; a first negative pad provided in the first mounting region connected to the first output pad; a second positive pad provided in the first mounting region; a second negative pad provided in the first mounting region; a second mounting region; a third positive pad provided in the second mounting region and connected to the second positive pad; a third negative pad provided in the second mounting region and connected to the second negative pad; a fourth positive pad provided in the second mounting region; a fourth negative pad provided in the second mounting region; a second input/output region; a second input pad provided in the second input/output region and connected to the fourth positive pad; and a second output pad provided in the second input/output region and connected to the fourth negative pad.


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Hong, Changui. (2026). Test substrate, test device, and test method (U.S. Patent No. 12796408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12796408

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