The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Jun. 15, 2023
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Lin-Yu Huang, Hsinchu, TW;

Li-Zhen Yu, New Taipei City, TW;

Chia-Hao Chang, Hsinchu City, TW;

Cheng-Chi Chuang, New Taipei City, TW;

Kuan-Lun Cheng, Hsin-Chu, TW;

Chih-Hao Wang, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 64/23 (2025.01); H10D 30/62 (2025.01); H10D 64/01 (2025.01); H10D 64/27 (2025.01); H10D 64/66 (2025.01); H10D 64/68 (2025.01); H10D 84/01 (2026.01); H10D 84/03 (2025.01); H10W 20/00 (2026.01);
U.S. Cl.
CPC ...
H10D 64/258 (2025.01); H10D 30/62 (2025.01); H10D 64/01324 (2026.01); H10D 64/015 (2025.01); H10D 64/017 (2025.01); H10D 64/021 (2025.01); H10D 64/254 (2025.01); H10D 64/518 (2025.01); H10D 64/666 (2025.01); H10D 84/0147 (2025.01); H10D 84/0149 (2025.01); H10D 84/038 (2025.01); H10W 20/063 (2026.01); H10W 20/0633 (2026.01); H10W 20/069 (2026.01); H10W 20/0693 (2026.01); H10D 64/691 (2025.01);
Abstract

A semiconductor device includes a metal gate structure having sidewall spacers disposed on sidewalls of the metal gate structure. In some embodiments, a top surface of the metal gate structure is recessed with respect to a top surface of the sidewall spacers. The semiconductor device may further include a metal cap layer disposed over and in contact with the metal gate structure, where a first width of a bottom portion of the metal cap layer is greater than a second width of a top portion of the metal cap layer. In some embodiments, the semiconductor device may further include a dielectric material disposed on either side of the metal cap layer, where the sidewall spacers and a portion of the metal gate structure are disposed beneath the dielectric material.


Find Patent Forward Citations

Quick Actions:

Huang, Lin-Yu. (2026). Contact formation method and related structure (U.S. Patent No. 12796056). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12796056

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