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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12793950 B1

PDFFull Text
Date of Patent:
Nov. 10, 2026

Filed:

Apr. 21, 2023

Nanoparticle detection threshold determination through local minimum analysis

Applicant:

Elemental Scientific, Inc., Omaha, NE (US);

Inventors:

Cole J. Nardini, Omaha, NE (US);

Austin Schultz, Omaha, NE (US);

Daniel R. Wiederin, Omaha, NE (US);

Assignee:

Elemental Scientific, Inc., Omaha, NE (US);

Attorneys:

Kevin E. West

Advent, LLP

Primary Examiner:

Wyatt A Stoffa

Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/04 (2006.01); H01J 49/10 (2006.01); H01J 49/36 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0031 (2013.01); H01J 49/0036 (2013.01); H01J 49/045 (2013.01); H01J 49/105 (2013.01); H01J 49/36 (2013.01);
Abstract

Systems and methods are described for analyzing local minimum data from spectrometry data for the determination of nanoparticle detection thresholds are described. In aspects, a histogram of the spectrometry data is used to search for potential local minimum values, which are subsequently validated to establish a nanoparticle detection threshold for the spectrometry data, with ion intensity values less than the nanoparticle detection threshold being attributable to signal background.

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Nardini, Cole. (2026). Nanoparticle detection threshold determination through local minimum analysis (U.S. Patent No. 12793950). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12793950

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