Memory device having variable impedance memory cells and time-to-transition sensing of data stored therein

Abstract

The present disclosure relates to circuits, systems, and methods of operation for a memory device. In an example, a memory device includes a plurality of memory cells, each memory cell having a data node, a first transistor, a second transistor, a third transistor, a write port for writing data to be stored in the memory cell, and a read port having a variable impedance that varies in accordance with a respective data value stored therein. The data value is one of at least three different data values that the memory cell is capable of storing. The second transistor and third transistor are coupled in series between the read port and a fixed reference. The first transistor is coupled between the write port and the data node.