The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Apr. 21, 2023
Applicant:

Imec Vzw, Leuven, BE;

Inventors:

Bappaditya Dey, Heverlee, BE;

Enrique Dehaerne, Leuven, BE;

Sandip Halder, Bierbeek, BE;

Assignee:

Imec vzw, Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/776 (2022.01); G06V 10/70 (2022.01); G06V 10/77 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/776 (2022.01); G06V 10/7715 (2022.01); G06V 10/82 (2022.01); G06V 10/87 (2022.01);
Abstract

The present disclosure related to a computer-implemented training and prediction method for defect detection, classification and segmentation in image data. The training method comprises providing an ensemble of learning structures, each learning structure comprising a feature extractor module, a region proposal module, a detection module, and a segmentation module. Each learning structure is trained individually and validated. Learning structures whose validation prediction score exceeds a predetermined threshold score are selected and their predictions combined, using a parametrized ensemble voting structure.


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Dey, Bappaditya. (2026). Automated defect classification and detection (U.S. Patent No. 12793398). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12793398

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