The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2026
Filed:
Mar. 14, 2023
Google Llc, Mountain View, CA (US);
Hanjun Dai, San Jose, CA (US);
Dale Eric Schuurmans, Edmonton, CA;
Xinyun Chen, Berkeley, CA (US);
Dengyong Zhou, Redmond, WA (US);
Bo Dai, San Jose, CA (US);
Hongyu Ren, Stanford, CA (US);
GOOGLE LLC, Mountain View, CA (US);
Abstract
Provided are computing systems, methods, and platforms for negative sampling in knowledge graphs with improved efficiency. A knowledge graph comprising entities and links between the entities can be obtained. A query computation graph comprising nodes and edges can be generated based on the knowledge graph. The nodes of the query computation graph can include anchor nodes, a root node, and intermediate nodes positioned in paths between the anchor nodes and the root node. A node cut of a query of the query computation graph can be determined and can include at least one node that cuts at least one path between each anchor node and the root node of the query computation graph. Negative samples can be identified by bidirectionally traversing the query computation graph in a first direction from the anchor nodes to the node cut and in a second direction from the root node to the node cut.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile