The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Feb. 02, 2024
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

George Alexis Bordakov, Sugar Land, TX (US);

Shin Utsuzawa, Sugar Land, TX (US);

David F. Allen, Sugar Land, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01); G01N 24/08 (2006.01); G01R 33/38 (2006.01); G01R 33/56 (2006.01); G01R 33/561 (2006.01); G01V 3/32 (2006.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01); G01R 33/5608 (2013.01); G01V 3/32 (2013.01); G01N 24/081 (2013.01); G01R 33/3808 (2013.01); G01R 33/5617 (2013.01);
Abstract

The present disclosure relates to various systems and methods for utilizing these T1-T2 maps for enhanced formation evaluation. For example, as described in greater detail herein, these techniques include: (1) Tikhonov regularization used in an NMR inversion and resultant bias, (2) variable depth averaging of NMR two-dimensional (2D) maps on per T1-T2 basis, and (3) NMR kernel correction.


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Quick Actions:

Bordakov, George. (2026). Systems and methods for enhanced formation evaluation using t1-t2 maps (U.S. Patent No. 12791752). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12791752

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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