The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Oct. 30, 2023
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

James Rohrkemper, Harbor Springs, MI (US);

Yifan Wu, San Diego, CA (US);

Guang C. Wang, San Diego, CA (US);

Kenny C. Gross, Escondido, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/10 (2006.01);
U.S. Cl.
CPC ...
G01V 3/10 (2013.01);
Abstract

Systems, methods, and other embodiments for passive component (e.g., spychip) detection through polarizability and advanced pattern recognition are described. In one embodiment a method includes applying an electromagnetic field to a target electronic system while the target electronic system is emitting a test pattern of electromagnetic interference. The method takes measurements of combined electromagnetic field strength emitted by the target electronic system while the electromagnetic field is being applied. The method detects the passive component based on dissimilarity between the measurements and estimates of electromagnetic field strength for the test pattern for a golden electronic system. The golden electronic system is of similar construction to the target electronic system and does not include the passive component. The method generates an electronic alert that the passive component is present in the target electronic system.


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Rohrkemper, James. (2026). Passive component detection through applied electromagnetic field against electromagnetic interference test pattern (U.S. Patent No. 12791748). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12791748

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