The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Sep. 04, 2024
Applicant:

Aurora Operations, Inc., Pittsburgh, PA (US);

Inventor:

Philip Warshowsky, Pittsburgh, PA (US);

Assignee:

AURORA OPERATIONS, INC., Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/4865 (2020.01); B60W 60/00 (2020.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4866 (2013.01); B60W 60/001 (2020.02); G01S 17/931 (2020.01); B60W 2420/408 (2024.01); B60W 2554/4042 (2020.02); B60W 2554/802 (2020.02); B60W 2710/18 (2013.01); B60W 2710/20 (2013.01);
Abstract

A LIDAR sensor system includes one or more processors. The processors transmit a signal to an environment of the LIDAR sensor system, receive, from an object in the environment, a return signal in response to transmitting the signal, determine correlation data between the signal and the return signal, identify, in the correlation data, an initial location of a peak, convolve the correlation data with a predetermined function to refine the initial location of the peak, and in response to the refined location of the peak, determine at least one of a distance to the object from the LIDAR sensor system or a velocity of the object.


Find Patent Forward Citations

Quick Actions:

Warshowsky, Philip. (2026). Systems and methods for lidar measurement with reduced peak-fitting bias (U.S. Patent No. 12791683). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12791683

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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