The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Mar. 28, 2022
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventors:

Norihito Suzuki, Kanagawa, JP;

Hiroaki Fujita, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31705 (2013.01);
Abstract

The present disclosure relates to a measurement device capable of taking measurements more accurately. A measurement device is provided, the measurement device including: a PLL circuit used in common to generate both a transmission RF signal and a reception LO signal that are high-frequency signals at different frequencies; an IQ correction unit that corrects IQ error in an LO signal used to generate at least one of the transmission RF signal or the reception LO signal; and a switching unit that switches between an on state in which correction by the IQ correction unit is performed and an off state in which the correction is not performed. The present disclosure can be applied in a vector network analyzer, for example.


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Suzuki, Norihito. (2026). Measurement device (U.S. Patent No. 12791612). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12791612

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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