The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Dec. 02, 2022
Applicants:

Ecole Polytechnique, Palaiseau, FR;

Ecole Nationale Superieure Des Techniques Avancees, Palaiseau, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Inventor:

Philippe Zeitoun, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); G01N 23/046 (2013.01);
Abstract

An imaging method for determining a parameter δ of real and imaginary parts of a sample complex optical index; the method using an X-ray source to illuminate the sample, a perforated grating arranged between the sample and the detector, and a signal processing unit; the method performing measurement while illuminating the sample, the X-rays reaching the detector forming a spot for each grating hole; for each measurement and for each grating hole, analysing the grating spot by determining a spot barycenter using a centroid-finding technique, determining an offset of the barycenter relative to a reference barycenter and determining a local phase variation via the offset of the barycenter, determining an amplitude of the X-rays forming the spot and determining a local attenuation relative to a reference amplitude, determining the parameter δ on the basis of the local phase variation, and determining the imaginary part β via the local attenuation.


Find Patent Forward Citations

Quick Actions:

Zeitoun, Philippe. (2026). Phase-contrast imaging method for estimating the local stoichiometry of a sample (U.S. Patent No. 12791496). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12791496

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