The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2026
Filed:
Dec. 13, 2024
Samsung Electronics Co., Ltd., Suwon-si, KR;
Yeny Yim, Suwon-si, KR;
Dongok Kim, Suwon-si, KR;
Won-Hee Lee, Suwon-si, KR;
Byeongseon Choi, Suwon-si, KR;
Eunjin Choi, Suwon-si, KR;
Han-Saem Park, Suwon-si, KR;
Sang-Min Han, Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
Apparatus for analyzing images includes a memory and a processor, and the processor is configured to, by executing the at least one instruction stored in the memory, detect an image coordinate of a defect position in a defect reaction image acquired by imaging a semiconductor device, generate a golden image of the semiconductor device based on a plurality of pattern images acquired by imaging a plurality of semiconductor devices, generate a design layout image corresponding to the pattern image based on a design layout of the plurality of semiconductor devices, generate relationship information between a pattern image and the design layout image based on the pattern image, the golden image, and the design layout image, and extract a design layout image coordinate corresponding to the defect position from the design layout image using the image coordinate of the defect position in the defect reaction image and the generated relationship information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile