The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Nov. 08, 2023
Applicant:

Toppan Inc., Tokyo, JP;

Inventors:

Shinichi Miyamoto, Tokyo, JP;

Kae Tochigi, Tokyo, JP;

Megumi Kashiwame, Tokyo, JP;

Kenji Nose, Tokyo, JP;

Assignee:

TOPPAN INC., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 17/00 (2006.01);
U.S. Cl.
CPC ...
G01N 17/002 (2013.01); G01N 17/004 (2013.01);
Abstract

The weather resistance testing apparatus includes a pressurizable container, a sample holder, and a light irradiation device having a light source. The pressurizable container has a quartz glass plate that can transmit light. The sample holder is disposed in the pressurizable container and can hold a sample. In this weather resistance testing apparatus, the light irradiation device is disposed outside the pressurizable container and irradiates the sample with light from the light source via the quartz glass plate.


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Miyamoto, Shinichi. (2026). Weather resistance testing apparatus and weather resistance testing method (U.S. Patent No. 12791465). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12791465

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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