The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

Nov. 26, 2021
Applicant:

Endress+hauser Flowtec Ag, Reinach, CH;

Inventors:

Thomas Sulzer, Basel, CH;

Florent Tschambser, Hesingue, FR;

Werner Wohlgemuth, Seewen, CH;

Lars Dreher, Ballrechten Dottingen, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/58 (2006.01);
U.S. Cl.
CPC ...
G01F 1/584 (2013.01); G01F 1/58 (2013.01);
Abstract

The present disclosure relates to a measuring device including a measuring pipe for conducting a flowable medium. The measuring pipe has an inner lateral surface designed to be, at least in portions, electrically insulating, and at least one monitoring electrode. The at least one monitoring electrode is arranged on the electrically insulating portion of the inner lateral surface in a medium-contacting manner. The measuring device also includes a measuring apparatus for determining a process property of the medium, and an abrasion detection device which is designed to determine at least one variable corresponding to an abrasion of the at least one monitoring electrode.


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Sulzer, Thomas. (2026). Measuring device and method for determining an abrasion (U.S. Patent No. 12791369). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12791369

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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