The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2026
Filed:
Feb. 14, 2024
Mitsubishi Electric Corporation, Tokyo, JP;
Takanori Yamauchi, Tokyo, JP;
Junya Nishioka, Tokyo, JP;
Yukari Miyagi, Tokyo, JP;
Hiroki Goto, Tokyo, JP;
Yoshiaki Konishi, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
An optical measurement device includes: a splitter to split light into measurement light and reference light; a switch interferometer to output first interference light obtained by causing two orthogonally polarized waves of the reference light to interfere with each other, second interference light obtained by causing two orthogonally polarized waves of reflected light from a target object of the measurement light to interfere with each other, and third interference light obtained by causing the reference light and the reflected light to interfere with each other; a photoelectric converter to convert the interference light into electric signals; a digital converter to perform A/D conversion on the electric signals; and a calculation processor to obtain an optical path-length difference between the two orthogonally polarized waves of each of the reference light and the reflected light, and an optical path-length difference between the reference light and the measurement light.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile