The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2026

Filed:

May. 24, 2023
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Tatsuo Hariyama, Tokyo, JP;

Masahiro Watanabe, Tokyo, JP;

Kenji Maruno, Tokyo, JP;

Hirohito Akiyama, Tokyo, JP;

Hidehiko Kando, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02015 (2022.01); G01B 9/02 (2022.01); G01B 9/02055 (2022.01); G01B 11/00 (2006.01); G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02025 (2013.01); G01B 9/0205 (2013.01); G01B 9/02067 (2013.01); G01B 11/002 (2013.01); G01B 11/026 (2013.01);
Abstract

A distance measuring device measures a distance to a target object with high accuracy by reducing stray light in a probe tip end section. In the distance measuring device, the probe tip end section has an optical path switching element that switches an optical path of measurement light incident from the optical element, at a tip end of the probe tip end section. A material of at least a part of the probe tip end section provided at a position opposite to a fifth surface absorbs the measurement light.


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Hariyama, Tatsuo. (2026). Distance measuring device and distance measuring method (U.S. Patent No. 12791300). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12791300

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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