The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2026
Filed:
Jun. 14, 2024
Applicant:
Ohio State Innovation Foundation, Columbus, OH (US);
Inventors:
Jun Liu, Columbus, OH (US);
Sunny Kwok, Cincinnati, OH (US);
Assignee:
Ohio State Innovation Foundation, Columbus, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/10 (2006.01); A61B 8/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 8/10 (2013.01); A61B 8/485 (2013.01); G06T 7/0014 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/30041 (2013.01);
Abstract
A computer-implemented method for measuring biophysical properties of an eye. The computer-implemented method includes receiving ultrasound data and determining, preprocessing the ultrasound data to improve its signal-to-noise, and using ocular pulse elastography (OPE) to determine a measurement of a posterior portion of an eye of a subject based on the ultrasound data.
Quick Actions:
Liu, Jun. (2026). Systems and methods for measuring biophysical attributes of the posterior eye (U.S. Patent No. 12788361). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12788361
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile