The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2026
Filed:
Aug. 21, 2023
The Regents of the University of California, Oakland, CA (US);
Lourdes Swentek, Orange, CA (US);
Thomas Milner, Irvine, CA (US);
Nitesh Katta, Irvine, CA (US);
Yona Tadir, Irvine, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
Internal cervical exams during labor pose multiple challenges, including infection risk, subjectivity, invasiveness, and discomfort. A monitoring system described herein enables non-invasive and accurate measurement of cervical dilation and assessment of the baby's station. By inserting a narrow linear ultrasound probe through the working channel, high-resolution ultrasound images of the cervix can be obtained, eliminating the need for painful and subjective exams, reducing infection risk, and enhancing patient comfort. Moreover, the ultrasound capability allows for potential monitoring of maternal and fetal blood oxygenation levels, providing a comprehensive picture of fetal well-being.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile