The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2026
Filed:
Dec. 16, 2021
Optomed Plc, Oulu, FI;
Ilkka Alasaarela, Oulu, FI;
Juho Pylvänäinen, Oulu, FI;
Juha Lipponen, Oulu, FI;
Seppo Rönkkö, Oulu, FI;
OPTOMED PLC, Oulu, FI;
Abstract
An ophthalmic examination apparatus comprises an alignment light generator, which directs beams of light from separate locations toward an image of an aperture stop of an imaging unit of the ophthalmic examination apparatus, and causes an envelope of the beams of light to converge to and diverge from a waist, which is within an alignment range of the ophthalmic examination apparatus. An eye is at an examination location with respect to the imaging unit when the waist of the envelope is located at least partly inside a pupil of the eye. The examination location of the ophthalmic examination apparatus is within the alignment range. The imaging unit receives reflections of the beams of light from a cornea of the eye within the alignment range, the eye being similar to a standard eye within standard tolerances. A user interface of the ophthalmic examination apparatus presents guidance information on a location of the eye with respect to the examination location based on locations of the reflections of the beams of light on a detecting surface of the imaging unit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile