The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Nov. 26, 2024
Applicant:

Rakuten Mobile, Inc., Tokyo, JP;

Inventors:

Hiroya Yatagai, Tokyo, JP;

Masaaki Kosugi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 41/069 (2022.01); H04L 41/22 (2022.01);
U.S. Cl.
CPC ...
H04L 41/069 (2013.01); H04L 41/22 (2013.01);
Abstract

There is provided a network management apparatus performing a first storage process, a second storage process, a search process, and a presentation process. The first storage process stores logs of a plurality of components constituting a virtualization environment of a network. The second storage process stores correspondence information in which, for each failure that may occur in the network, error logs of the plurality of components related to the failure are associated with each other. The search process searches, when a failure occurs in the network, based on an error log of a first component among the plurality of components, for an error log of a second component related to the failure from the stored logs using the correspondence information. The presentation process presents a result of the search to a user.


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Yatagai, Hiroya. (2026). Log analysis when failure occurs in virtualization environment (U.S. Patent No. 12786048). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12786048

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