The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Mar. 11, 2022
Applicant:

Lenovo (Beijing) Limited, Beijing, CN;

Inventors:

Hongmei Liu, Beijing, CN;

Yuantao Zhang, Beijing, CN;

Zhi Yan, Beijing, CN;

Ruixiang MA, Beijing, CN;

Haiming Wang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04L 5/0048 (2013.01); H04L 5/0092 (2013.01);
Abstract

Embodiments of the present application are related to a method and apparatus of measurement and reporting for beam determination. According an embodiment of the present application, an exemplary method includes: receiving first information indicating one or more sets of reference signal (RS) from a second RAN node; receiving second information indicating at least one of a first number of first spatial domain filter for a link between the second RAN node and the RAN node, a second number of second spatial domain filter for a link between the RAN node and a third node; or a third number based on the first number and the second number; and determining at least one spatial domain filter associated with at least one RS of the one or more sets of RS at least based on the second information.


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Liu, Hongmei. (2026). Method and apparatus of measurement and reporting for beam determination (U.S. Patent No. 12785887). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12785887

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