The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Oct. 31, 2024
Applicant:

Avago Technologies International Sales Pte. Limited, Singapore, SG;

Inventor:

Juin-Hwey Chen, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0045 (2013.01);
Abstract

An apparatus may receive a first copy, a second copy and a third copy of data including a cyclic redundancy check (CRC) code, determine a set of bit positions, at each of which at least two of the first copy, the second copy or the third copy have bit values different from each other, perform a bit flip on the first copy at one or more bit positions to generate second data, calculate a number of operations for calculating respective sums of CRC syndromes corresponding to a plurality of sets of one bit position, two bit positions or three bit positions, among the set of bit positions, determine that the number of operations does not exceed a threshold, and correct, based on flipped bit positions among the set of bit positions in the second data and the respective sums of CRC syndromes, an error contained in the first copy.


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Chen, Juin-Hwey. (2026). Systems and methods for cyclic redundancy check error correction with reduced computational complexity (U.S. Patent No. 12785853). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12785853

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