The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Feb. 14, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Toru Yokoyama, Tokyo, JP;

Michiru Fujioka, Tokyo, JP;

Ayaka Okuno, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16B 5/00 (2019.01); C12Q 1/6809 (2018.01); G16B 40/20 (2019.01);
U.S. Cl.
CPC ...
G16B 5/00 (2019.02); C12Q 1/6809 (2013.01); G16B 40/20 (2019.02);
Abstract

A genotype analysis device includes an electrophoresis device and a data analysis device. A mobility model management unit including an environment information receiving unit, a prediction model storage unit, and a mobility prediction unit is provided in an STR analysis unit of the data analysis device. The mobility prediction unit generates a prediction model for predicting a correction amount of a standard base length of an allele, based upon an environmental condition at the time of electrophoresis received by the environmental information receiving unit and an electrophoresis result of an allelic ladder. A base length of the allele is corrected from the environmental condition without using the allelic ladder by using the prediction model.


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Yokoyama, Toru. (2026). Genotype analysis device and method (U.S. Patent No. 12784868). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12784868

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