The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Mar. 28, 2024
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventors:

Hyun Seung Kim, Icheon-si, KR;

Hyeong Soo Jeong, Icheon-si, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01);
U.S. Cl.
CPC ...
G11C 29/44 (2013.01);
Abstract

A semiconductor apparatus includes a data alignment circuit and a data pattern control circuit. The data alignment circuit aligns data input through each of a plurality of data input/output pads to generate a plurality of alignment data. The data pattern control circuit generates a plurality of preliminary write data by copying some bits of a first alignment data among the plurality of alignment data to a plurality of input paths coupled to data input/output pads other than a first data input/output pad among the plurality of data input/output pads, and changes a pattern of the plurality of preliminary write data according to remaining bits of the first alignment data to generate a plurality of write data.


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Kim, Hyun. (2026). Semiconductor apparatus having test function and semiconductor system including the same (U.S. Patent No. 12784861). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12784861

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