The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Oct. 20, 2023
Applicant:

Betterview Marketplace, Inc., San Francisco, CA (US);

Inventors:

Julius Simonelli, San Diego, CA (US);

Ilsoo Seong, Aliso Viejo, CA (US);

Jason Janofsky, San Marcos, CA (US);

Nicholas Molyneux, San Diego, CA (US);

David Tobias, Burlingame, CA (US);

David Lyman, Houston, TX (US);

Peter Tran, San Diego, CA (US);

Hiroshi Kobayashi, Mission Viejo, CA (US);

Assignee:

NEARMAP US, INC., Lehi, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/10 (2022.01); G06T 3/20 (2006.01); G06T 3/60 (2024.01); G06T 7/33 (2017.01); G06T 7/73 (2017.01); G06T 11/23 (2026.01);
U.S. Cl.
CPC ...
G06V 20/176 (2022.01); G06T 3/20 (2013.01); G06T 3/60 (2013.01); G06T 7/33 (2017.01); G06T 7/73 (2017.01); G06T 11/23 (2026.01); G06V 20/188 (2022.01); G06T 2207/10032 (2013.01); G06T 2207/20081 (2013.01);
Abstract

Methods, non-transitory computer readable media, and building analysis systems are disclosed that analyze an overhead image to generate a building outline for a building associated with a property represented by the overhead image. The overhead image is included in imagery data obtained from an overhead imagery server based on a received request comprising a geographic location for the property. The building outline is then shifted or rotated. Segment(s) of the building outline are slid to match identified wall(s) of the building. The building outline is then modified based on property feature(s) detected based on an application of one or more trained machine learning classifiers to the overhead image. At least a portion of the overhead image is output with a graphical overlay comprising the building outline via a user interface in response to the received request.


Find Patent Forward Citations

Quick Actions:

Simonelli, Julius. (2026). Image analysis systems and methods for determining building footprint (U.S. Patent No. 12784440). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12784440

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