The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Nov. 17, 2023
Applicant:

Ohio State Innovation Foundation, Columbus, OH (US);

Inventors:

Matthew Bendel, Columbus, OH (US);

Rizwan Ahmad, Columbus, OH (US);

Philip Schniter, Columbus, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 12/20 (2026.01); G16H 30/40 (2018.01);
U.S. Cl.
CPC ...
G06T 12/20 (2026.01); G16H 30/40 (2018.01); G06T 2211/441 (2023.08);
Abstract

Example deep learning systems and related methods for posterior sampling in inverse problems are described herein. An example method for training a deep learning model includes receiving a training dataset including a plurality of input/output pairs; and training a conditional generative adversarial network (cGAN) using the training dataset, where the training includes a regularization process configured to enforce consistency with a posterior mean and a posterior covariance or trace-covariance.


Find Patent Forward Citations

Quick Actions:

Bendel, Matthew. (2026). Conditional generative adversarial network (cgan) for posterior sampling and related methods (U.S. Patent No. 12784310). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12784310

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…