The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Dec. 17, 2024
Applicants:

SK on Co., Ltd., Seoul, KR;

SK Innovation Co., Ltd., Seoul, KR;

Inventors:

Hyeong Won Kim, Daejeon, KR;

Won Seok Choi, Daejeon, KR;

Assignees:

SK On Co., Ltd., Seoul, KR;

SK Innovation Co., Ltd., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 23/04 (2018.01); G01N 23/06 (2018.01); G01N 23/2251 (2018.01); G01N 33/2028 (2019.01); G06T 7/90 (2017.01); G06V 10/56 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01N 23/04 (2013.01); G01N 23/06 (2013.01); G01N 23/2251 (2013.01); G01N 33/2028 (2019.01); G06T 7/90 (2017.01); G06V 10/56 (2022.01); G01N 2223/401 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/30136 (2013.01); G06V 2201/06 (2022.01);
Abstract

A apparatus for analyzing a composition of an intermetallic compound includes a database storing data of a plurality of feature areas matched to respective composition ratios, a plurality of brightness range data corresponding to the plurality of respective feature areas, and color data, for an intermetallic compound generated during welding of dissimilar metals, a microscope image acquisition unit acquiring an electron microscope image including a brightness value for the intermetallic compound to be analyzed, a signal processor extracting a unit brightness value corresponding to each preset image basic unit from the electron microscope image and searching for color data of a corresponding feature area from the database based on the unit brightness value, and an image processor applying searched color data to the electron microscope image and generating a colorization image.


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Kim, Hyeong. (2026). Apparatus and method for analyzing composition of intermetallic compounds (U.S. Patent No. 12784185). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12784185

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