The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Jun. 27, 2024
Satoshi Suzuki, Kanagawa, JP;
Satoshi Suzuki, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An inspection apparatus includes a reading device to read a printed medium on which a form is printed in advance to generate first image data, a printed matter being the printed medium on which an image is printed by a printing apparatus based on print data to generate second image data, and circuitry. The circuitry is to generate a difference image between the second image data and a master image, the master image being generated from the print data, generate a mask image on which a portion of the form in the first image data is expanded, execute mask processing on the difference image using the mask image, and determine whether a defect exists on the printed matter based on the difference image on which the mask processing is executed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile