The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Apr. 16, 2024
Applicant:

SK on Co., Ltd., Seoul, KR;

Inventors:

Ung Bae Park, Daejeon, KR;

Do Young Kim, Daejeon, KR;

Assignee:

SK ON CO., LTD., Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/13 (2017.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/13 (2017.01); G06T 7/60 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A master jig and an equipment diagnosis method using the same are disclosed. The master jig may include a case and a marking member coupled to an outer surface of the case. The equipment diagnosis method may include a step of moving the master jig inserted into a transfer device in one direction, a step in which an optical system photographs an outer surface of the master jig to acquire an image of the master jig, and a step in which a controller analyzes the image of the master jig to diagnose a state of the optical system.


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Park, Ung. (2026). Master jig and equipment diagnosis method using the same (U.S. Patent No. 12784181). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12784181

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