The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Oct. 28, 2024
Samsung Electronics Co., Ltd., Suwon-si, KR;
Yongsup Park, Suwon-si, KR;
Sangwook Baek, Suwon-si, KR;
Sangmi Lee, Suwon-si, KR;
Youjin Lee, Suwon-si, KR;
Taeyoung Jang, Suwon-si, KR;
Gyehyun Kim, Suwon-si, KR;
Beomseok Kim, Suwon-si, KR;
Youngo Park, Suwon-si, KR;
Kwangpyo Choi, Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
Provided is an image processing method including upscaling an input image to generate an upscaled image, obtaining a first feature map and a second feature map by inputting the upscaled image to a convolutional neural network and performing a convolution operation on the upscaled image with one or more kernels included in the convolutional neural network, obtaining a gain map by inputting the first feature map to a first convolutional layer, obtaining an offset map by inputting the second feature map to a second convolutional layer, and generating an output image, based on the upscaled image, the gain map, and the offset map, wherein the convolutional neural network is configured to be trained to reduce a difference between a hue of the input image and a hue of the output image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile