The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Mar. 08, 2023
Oracle International Corporation, Redwood Shores, CA (US);
Keyang Ru, Kirkland, WA (US);
Guang Chao Wang, San Diego, CA (US);
Ruixian Liu, San Diego, CA (US);
Kenny C. Gross, Escondido, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Systems, methods, and other embodiments associated with inverse-density exemplar selection for improved multivariate anomaly detection are described. In one embodiment, a method includes determining magnitudes of vectors from a set of time series readings collected from a plurality of sensors. And, the example method includes selecting exemplar vectors from the set of time series readings to train a machine learning model to detect anomalies. The exemplar vectors are selected by repetitively (i) increasing a first density of extreme vectors that are within tails of a distribution of amplitudes for the time series readings based on the magnitudes of vectors, and (ii) decreasing a second density of non-extreme vectors that are within a head of the distribution based on the magnitudes of vectors. The repetition continues until the machine learning model generates residuals within a threshold in order to reduce false or missed detection of the extreme vectors as anomalous.
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