The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Sep. 12, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Junjiao Tian, Atlanta, GA (US);

Yen-Chang Hsu, Fremont, CA (US);

Yilin Shen, Santa Clara, CA (US);

Hongxia Jin, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/01 (2023.01);
U.S. Cl.
CPC ...
G06N 7/01 (2023.01);
Abstract

A method includes providing, using at least one processing device of an electronic device, input data to a machine learning model. The method also includes extracting, using the at least one processing device, features of the input data. The method further includes performing, using the at least one processing device, a geometric transformation of the features, where the geometric transformation is based on first and second parametric instance-dependent scalar functions. In addition, the method includes producing, using the at least one processing device, a predictive probability distribution based on the transformed features.


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Tian, Junjiao. (2026). Disentangled out-of-distribution (ood) calibration and data detection (U.S. Patent No. 12783921). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12783921

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