The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Feb. 11, 2022
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Maja Rudolph, Madison, WI (US);

Chen Qiu, Sindelfingen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/088 (2023.01); G06N 3/0895 (2023.01);
U.S. Cl.
CPC ...
G06N 3/088 (2013.01); G06N 3/0895 (2023.01);
Abstract

A device control system includes a controller. The controller may be configured to, receive a data set of N samples that includes normal and unlabeled unidentified anomalous data samples, process, via a model, the data set to produce an anomaly score associated with each sample in the data set, rank the normal and anomalous data samples according to the anomaly score associated with each data sample to produce a ranked order, label a fraction α of the N samples that have the highest scores with an anomaly label and the remaining samples with a normal label, retrain the model using all N samples, the labels, and a joint loss function, repeat the process, rank, label, and retrain steps until the ranked order and labels for all of the N samples do not change, and operate the device control system based on the trained model.


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Rudolph, Maja. (2026). Latent outlier exposure for anomaly detection (U.S. Patent No. 12783892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12783892

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