The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Dec. 13, 2024
Applicant:

Dell Products, L.p., Round Rock, TX (US);

Inventors:

Boris Shpilyuck, Ashdod, IL;

Hemant Ramesh Gaikwad, Pune, IN;

Igor Dubrovsky, Beer Sheva, IL;

Nisan Haimov, Beer Sheva, IL;

Assignee:

DELL PRODUCTS L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 8/71 (2018.01); G06F 8/77 (2018.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 8/71 (2013.01); G06F 8/77 (2013.01); G06F 11/3688 (2013.01);
Abstract

Architectures and techniques are described that can determine a vulnerability factor (VF) for a microservice (or another suitable executable instruction unit) of a microservice platform (or another suitable software system or platform). The VF can be indicative of an aggregate vulnerability score of the microservice. The VF can combine an engineering risk score, a code complexity score, and/or a historical record score, each of which can be configurably weighted. A list of the microservices ranked or ordered according to the VF can be used to prioritize chaos testing procedures.


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Quick Actions:

Shpilyuck, Boris. (2026). Chaos testing prioritization using vulnerability factors (U.S. Patent No. 12783688). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12783688

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