The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Aug. 12, 2022
Applicant:

Palitronica Inc., Waterloo, CA;

Inventors:

Carlos Moreno, Waterloo, CA;

Sebastian Fischmeister, Waterloo, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01); G01R 33/02 (2006.01); G06F 21/80 (2013.01);
U.S. Cl.
CPC ...
G06F 21/566 (2013.01); G01R 33/02 (2013.01); G06F 21/80 (2013.01); G06F 2221/034 (2013.01);
Abstract

Apparatus, systems, methods for measuring a side-channel is disclosed. The methods involve obtaining a first measurement of a magnetic field in a first range from the side-channel of the at least one electronic device; generating a version of the side-channel; obtaining a second measurement of the magnetic field in a second range from the version of the side-channel; and generating a composite measurement of the magnetic field from the side-channel of the at least one electronic device based on the first measurement and the second measurement. The first range includes a minimum threshold and at least a portion of the second range is less than the minimum threshold of the first range.


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Moreno, Carlos. (2026). Apparatus and methods for extended range measurement of magnetic side-channels (U.S. Patent No. 12783666). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12783666

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