The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Sep. 24, 2024
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Xin Xiao, Nanjing, CN;

Yuming Xie, Nanjing, CN;

Yongsheng Deng, Nanjing, CN;

Hengchen Yuan, Nanjing, CN;

Jipeng Liu, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06F 21/577 (2013.01); G06F 2221/034 (2013.01);
Abstract

The technology of this application relates to a vulnerability assessment method and an analysis device. The analysis device obtains a plurality of pieces of vulnerability information of a computer device. The vulnerability information includes an identifier of a vulnerability, and each piece of vulnerability information indicates one vulnerability on the computer device. A plurality of vulnerabilities indicated by the plurality of pieces of vulnerability information may be on one computer device or different computer devices. The analysis device assesses, based on information about a threat event that is reported by a security device and/or vulnerability exploitation difficulty, threat degrees of the plurality of vulnerabilities to the computer device.


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Xiao, Xin. (2026). Vulnerability assessment method and analysis device (U.S. Patent No. 12783653). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12783653

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