The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Jun. 23, 2022
Applicants:

Inventec (Pudong) Technology Corporation, Shanghai, CN;

Inventec Corporation, Taipei, TW;

Inventors:

Wan-Ting Hsieh, Taipei, TW;

Sergio Gonzalez-Vazquez, Taipei, TW;

Trista Pei-Chun Chen, Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/21 (2023.01); A61B 5/021 (2006.01); G06F 18/2115 (2023.01);
U.S. Cl.
CPC ...
G06F 18/2193 (2023.01); A61B 5/021 (2013.01); G06F 18/2115 (2023.01);
Abstract

A data splitting method for validating machine learning is adapted to a BP (blood pressure) dataset having a plurality of subjects and includes: dividing measurement ranges of the SBP (systolic blood pressure) data and the DBP (diastolic blood pressure) data into first intervals and second intervals; generating a plurality of classes according to the first and second intervals, wherein each class includes one of the first intervals and one of the second intervals; determining and recording a match condition of the BP data of each subject and classes, and thereby generating a plurality of match conditions corresponding the plurality of subjects, wherein each match condition includes a plurality of labels corresponding to the classes, each label has a first state or a second state; and performing a distribution procedure according to the matching conditions to distribute the BP data of subjects into a plurality of subsets.


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Hsieh, Wan-Ting. (2026). Data splitting system and method for validating machine learning (U.S. Patent No. 12783606). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12783606

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