The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Apr. 30, 2025
Applicant:

Peernova, Inc., San Jose, CA (US);

Inventors:

Abraham Lloyd, San Francisco, CA (US);

Mehmet Orun, Philadelphia, PA (US);

Assignee:

PeerNova, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/20 (2019.01); G06F 16/23 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 16/2365 (2019.01);
Abstract

A database system may be implemented in a cloud computing environment. The database system may include a storage system storing a first data set including a first plurality of database records including a first plurality of database values corresponding to a first plurality of database fields and a second data set including a second plurality of database records including a second plurality of database values corresponding to a second plurality of database fields. The database system may include a data source profiler configured to determine data set profiling information for the first plurality of database fields and the second plurality of data fields. The database system may include a data source unifier configured to determine and execute one or more operations to unify the first and second data sets.


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Quick Actions:

Lloyd, Abraham. (2026). Data integration evaluation and profiling in a database system (U.S. Patent No. 12783554). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12783554

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