The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Apr. 21, 2025
Applicant:

Peernova, Inc., San Jose, CA (US);

Inventors:

Abraham Lloyd, Philadelphia, PA (US);

Mehmet Orun, San Francisco, CA (US);

Assignee:

PeerNova, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/20 (2019.01); G06F 16/23 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 16/2365 (2019.01);
Abstract

A database system may be implemented in a cloud computing environment. The database system may include a data profiler configured to perform operations such as identifying a set of database records, grouping the database records into different groups based on one or more outcome fields, and determining data profiling statistics for the differing groups. The data profiling statistics may be used to determine recommendations to update the database records to improve data integrity, data reliability, and/or outcome values.


Find Patent Forward Citations

Quick Actions:

Lloyd, Abraham. (2026). Data integration evaluation and profiling in a database system (U.S. Patent No. 12783553). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12783553

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