The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Jul. 16, 2018
Conduent Business Services, Llc, Florham Park, NJ (US);
Mark J. Stefik, Portola Valley, CA (US);
Daniel G. Bobrow, Palo Alto, CA (US);
Hoda Eldardiry, San Carlos, CA (US);
Robert T. Krivacic, San Jose, CA (US);
Pai Liu, Sunnyvale, CA (US);
Sureyya Tarkan, Palo Alto, CA (US);
Ed Wu, San Jose, CA (US);
Conduent Business Services, LLC, Florham Park, NJ (US);
Abstract
A computer-implemented system and method for performing trend analysis is provided. Event objects for events are stored in a database. A trigger for notifying a beginning of an event is received and an event object representing the event is generated. An event class is associated with a set of parameters and is assigned to the event object. A set of activity data for the event object is created. A time period for trend analysis and previous time periods are defined. Trends among the event objects during the trend analysis time period and among the event objects for the previous time periods are defined. The trends of the event objects of the trend analysis period are compared with the trends of the event objects for the previous time periods and significant trend changes between the compared trends are identified. A trend object is generated for each significant trend change.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile