The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Apr. 10, 2023
Applicant:

Stanley Electric Co., Ltd., Tokyo, JP;

Inventor:

Kenji Suina, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G02B 26/101 (2013.01); G02B 26/0816 (2013.01);
Abstract

An abnormality detection apparatus, which detects abnormality of a resonant sensor signal output from a sensor unit of an optical deflector, includes: a resonant sensor signal processing unit including a function of A/D-converting the resonant sensor signal output from the sensor unit into resonant sensor signal data, and a function of outputting a data acquisition completion and the A/D-converted resonant sensor signal data; a resonant sensor signal predicted-data calculation unit configured to calculate predicted data on the resonant sensor signal; and a resonant sensor signal abnormality determination unit configured, in a case where the mirror portion is in a resonant state, to compare the predicted data on the resonant sensor signal with actual resonant sensor signal data, and to detect abnormality of the resonant sensor signal based on a result of the comparison.


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Suina, Kenji. (2026). Abnormality detection apparatus, abnormality detection method, and program (U.S. Patent No. 12782715). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782715

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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